SAGE Analytical Lab: AFM-in-SEM LiteScope DEMO

Sign-up for the LiteScope demo at the SAGE Application lab. We will contact you to arrange a time and date.

Why attend the LIVE Demo?

Technical Expertise: Seeing the AFM-in-SEM in action helps you understand how integrating these two powerful microscopy techniques can provide more comprehensive insights into failure analysis.

Application-Specific Insights: You will discover how AFM-in-SEM is applied across a range of research and industrial applications, including semiconductors, materials science, and nanotechnology.

Precise Localization of Region of Interest

Experience site-specific, advanced AFM analysis of failure points with precise SEM navigation to cross-sections, lamellas, etc.

Key added values:

Correlative Multimodal Sample Analysis

Discover the comprehensive capabilities of combining AFM and SEM techniques, with full compatibility for SE, EDX, FIB, EBIC, and EBAC.

In-Situ Sample Characterization

See how LiteScope provides an all-in-one solution - analyzing samples in-situ with no transfers or contamination, allowing simultaneous AFM and SEM analysis under identical conditions.